PXI Semi SYSTEM.png

VATE

Features

* 33 MHz Test Rate
* 64 ~ 512 I/O Channels
* 32 M capture & fail log memory
* 32 M vector memory per channel
* PMU (per channel)
* 4 ~ 16 DPS or 64 ~ 128 SMU
* 16 ~ 128TMU
* 16 Timing sets & 2 Format sets change on the fly

High Light

* One test program for multi-site
* Max.16 site parallel test
* User friendly Software platform
* Prober interface ready

Target Device

CIS
MEMS Microphone
Fingerprint Identification

Application

Automatic Test Equipment (ATE)
Functional /DC/OpenShort Test
Digital Pattern Generation /Capture
MEMS / SENSOR Device Testing

PXI Semi SYSTEM.png

SATE

Features

* 33 MHz Test Rate
* 128 ~ 512  I/O Channels
* 32  ~ 128  I2C / SPI
* 32 M vector memory for pattern SPI mode
* Per channel PMU
* 4 ~ 16 DPS or 32 ~ 128 SMU
* 32 ~ 128TMU

High Light

* One test program for multi-site
* Max.128 site parallel test for Sensor device
* User friendly Software platform
* Customized Handler interface

Target Device

Accelerometer Sensor
Gyroscope Sensor
Light Sensor
Magnetic Sensor
Pressure Sensor
Temperature Sensor